IEEE Test and Diagnostics Standards

Ieee Information Model Standards for Test and Diagnosis

In this paper we discuss the use of information modeling to develop information exchange standards and metrics for test and diagnostics. For example, fault information is being transferred from one diagnostic reasoner to another. How many attributes does a fault have? One, three, fifteen? How do these attributes relate to the fault, to diagnosis, and tests? If both reasoners do not understand t...

An Overview of Group Key Management Issues in IEEE 802.16e Networks

The computer industry has defined the IEEE 802.16 family of standards that will enable mobile devices to access a broadband network as an alternative to digital subscriber line technology. As the mobile devices join and leave a network, security measures must be taken to ensure the safety of the network against unauthorized usage by encryption and group key management. IEEE 802.16e uses Multica...

The continuing evolution of EDA standards

BIST for network on chip communication infrastructure based on combination of extended IEEE 1149.1 and IEEE 1500 standards

In this paper we propose a BIST based method to test network on chip (NOC) communication infrastructure. The proposed method utilizes an IEEE 1149.1 architecture based on BIST to at-speed test of crosstalk faults for inter-switch links as well as an IEEE 1500-compliant wrapper to test switches themselves in NOC communication infrastructure. The former architecture includes enhanced cells intend...

SoC Test : Trends And Recent Standards

The well-known approaching test cost crisis, where semiconductor test costs begin to approach or exceed manufacturing costs has led test engineers to apply new solutions to the problem of testing System-On-Chip (SoC) designs containing multiple IP (Intellectual Property) cores. While it is not yet possible to apply generic test architectures to an IP core within a SoC, the emergence of a number...